Three-Dimensional Atomically Resolved Analytical Imaging with a Field Ion Microscope

Abstract Atom probe tomography (APT) helps elucidate the link between nanoscale chemical variations and physical properties, but it has a limited structural resolution. Field ion microscopy (FIM), predecessor technique to APT, is capable of attaining atomic resolution along certain sets crystallographic planes albeit at expense elemental identification. We demonstrate how two commercially available atom instruments, one with straight flight path fitted reflectron lens, can be used acquire time-of-flight mass spectrometry data concomitant FIM experiment. outline various experimental protocols making use temporal spatial correlations best discriminate field-evaporated signals from large field-ionized background signal, demonstrating an unsophisticated yet efficient mining strategy provide this discrimination. discuss remaining challenges that need addressed, notably concerned accurate detection identification individual ions contained within high flux contributes image. Our hybrid approach can, in principle, exhibit true discrimination capabilities, neither which nor individually fully deliver—thereby new approach, here broadly termed analytical field (aFIM), unique.